Paper/Nano Technology Books
Micro and Nanotechnology in Paper Manufacturing
Author- Dr. Mahendra Patel, (530 pages ); ISBN No. 978-81-923542-2-4);
Price: $ (USA) 120 + delivery charge
Minerals in Paper Manufacturing
(Author- Dr. Mahendra Patel, 32 chapters, 350 pages ; ISBN No. 978-81-923542-1-7).
Price: $ (USA) 65 + delivery charge
Operations and Recycling in Paper Mills with Micro and Nano Concepts
Author- Dr. Mahendra Patel; (22 chapters- 500 pages); ISBN No.978-81-923542-3-1)
Price: $ (USA) 150 + delivery charge
Materials for
Better Productivity in Pulp and Paper Mills: Metals and Polymers
(Author: Dr. Mahendra
Patel; 616 pages; 36 chapters; ISBN No.978-81-923542-5-5)
Price- US $230+
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Ceramics in Paper Manufacturing
including Advanced and Nano Materials
(Author: Dr.
Mahendra Patel, 420 pages; 32 chapters, ISBN No: 978-81-923542-4-8.)
Price: $ (USA) 220 + delivery charge
Contact: industrypaper@yahoo.co.uk
patel@nanoindustry.in
:Tel:91(0)9871787870
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Nanotechnology Update
Pulp, Paper and Packaging industries
04/08/2010
Combination of AFM and XRF
NT-MDT Company reported that their engineers together with the specialists from the Institute for Roentgen Optics are working on the design of a new and highly innovative system, which combines Atomic Force Microscope and Micro X-ray fluorescence module . This equipment will greatly enhance AFM capability by adding elemental identification as an option, which will be an important advance in the field of nanoscale instrumentation.The integrated system besides AFM includes X-ray tube with compact low voltage power supply, automatic multi-channel digital signal processor with dead- time correction and silicon drift detector (SDD -detector). MXRF module is compatible with any NTEGRA- platform based instrument. The combined system from NT-MDT for chemical elemental analysis offers several unique features. First and major of them is the system integration approach that allows joining two research techniques in one device - the AFM and the MXRF. This 2-in-1 system is capable to obtain the topography of the surface and study the elemental composition of the same area of the specimen with high space resolution. The entirely new idea stands behind the novel design of the system that integrates the Scanning Probe Microscopy with Micro X-ray fluorescence spectrometry. This new system represents the first step on this way, but the NTEGRA platform is well suitable for such integration experiments. Overall, the prospective of such broad nanotechnology instrumentation strategy looks well defined and successful.
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